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LibDriver BMM150
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bmm150 test driver modules More...
Functions | |
| uint8_t | bmm150_interrupt_test_irq_handler (void) |
| interrupt test irq | |
| uint8_t | bmm150_interrupt_test (bmm150_interface_t interface, bmm150_address_t addr_pin, float low_threshold_ut, float high_threshold_ut, uint32_t times) |
| interrupt test | |
| uint8_t | bmm150_read_test (bmm150_interface_t interface, bmm150_address_t addr_pin, uint32_t times) |
| read test | |
| uint8_t | bmm150_register_test (bmm150_interface_t interface, bmm150_address_t addr_pin) |
| register test | |
bmm150 test driver modules
| uint8_t bmm150_interrupt_test | ( | bmm150_interface_t | interface, |
| bmm150_address_t | addr_pin, | ||
| float | low_threshold_ut, | ||
| float | high_threshold_ut, | ||
| uint32_t | times ) |
interrupt test
| [in] | interface | chip interface |
| [in] | addr_pin | iic device address |
| [in] | low_threshold_ut | low threshold in ut |
| [in] | high_threshold_ut | high threshold in ut |
| [in] | times | test times |
Definition at line 139 of file driver_bmm150_interrupt_test.c.
| uint8_t bmm150_interrupt_test_irq_handler | ( | void | ) |
interrupt test irq
Definition at line 117 of file driver_bmm150_interrupt_test.c.
| uint8_t bmm150_read_test | ( | bmm150_interface_t | interface, |
| bmm150_address_t | addr_pin, | ||
| uint32_t | times ) |
read test
| [in] | interface | chip interface |
| [in] | addr_pin | iic device address |
| [in] | times | test times |
Definition at line 51 of file driver_bmm150_read_test.c.
| uint8_t bmm150_register_test | ( | bmm150_interface_t | interface, |
| bmm150_address_t | addr_pin ) |
register test
| [in] | interface | chip interface |
| [in] | addr_pin | iic device address |
Definition at line 51 of file driver_bmm150_register_test.c.